Polycrystalline Semiconductor Silicon Wafer

Polycrystalline Semiconductor Silicon Wafer

Test or monitor wafers are the second-best type of wafer. Despite this, they are similar to prime grade silicon wafers, except they are less expensive. Test or monitor wafers are less precise compared to prime grade wafers, but overall, test grade wafers have only a few non-complaints features. Test grade silicon wafers are great for equipment testing, semiconductor fabrication control management, testing, and more.

Beschreibung

Description

Test or monitor wafers are the second-best type of wafer. Despite this, they are similar to prime grade silicon wafers, except they are less expensive. Test or monitor wafers are less precise compared to prime grade wafers, but overall, test grade wafers have only a few non-complaints features. Test grade silicon wafers are great for equipment testing, semiconductor fabrication control management, testing, and more.

Specification

TYPE

DOPANT

ORIENTATION

RESISTIVITY (Ohm-cm)

THICKNESS (um)

BACKSIDE

TTV (um)

FLATS

PARTICLE

Control No.

P

BORON

<100>

1-30

675±25

Etched

≤10

1 Jeida

<=10@>=0.3

PG20

product-1-1

Beliebte label: polycrystalline semiconductor silicon wafer

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