Polycrystalline Semiconductor Silicon Wafer
Test or monitor wafers are the second-best type of wafer. Despite this, they are similar to prime grade silicon wafers, except they are less expensive. Test or monitor wafers are less precise compared to prime grade wafers, but overall, test grade wafers have only a few non-complaints features. Test grade silicon wafers are great for equipment testing, semiconductor fabrication control management, testing, and more.
Beschreibung
Description
Test or monitor wafers are the second-best type of wafer. Despite this, they are similar to prime grade silicon wafers, except they are less expensive. Test or monitor wafers are less precise compared to prime grade wafers, but overall, test grade wafers have only a few non-complaints features. Test grade silicon wafers are great for equipment testing, semiconductor fabrication control management, testing, and more.
Specification
|
TYPE |
DOPANT |
ORIENTATION |
RESISTIVITY (Ohm-cm) |
THICKNESS (um) |
BACKSIDE |
TTV (um) |
FLATS |
PARTICLE |
Control No. |
|
P |
BORON |
<100> |
1-30 |
675±25 |
Etched |
≤10 |
1 Jeida |
<=10@>=0.3 |
PG20 |

Beliebte label: polycrystalline semiconductor silicon wafer
Anfrage senden
Das könnte dir auch gefallen


